Fast periodicity-analysis with “4spots” and ImageJ
نویسنده
چکیده
Scattering experiments in the transmission electron microscope (TEM) result in a large number of phase-identification challenges. This note is first in a series on the inverse-problems associated with Bayesian model-selection and parameter-estimation [1] from TEM data. In particular here we present a fast method for determining two g-vectors and an inter-spot angle from your diffraction and HREM images.
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تاریخ انتشار 2012